Denis DAMIRON, Dr.

Damiron2.jpg Host Laboratory KAWAKATSU LAB.
Position in LIMMS Postdoctoral Researcher
Main Research Topic in LIMMS

NANOTECH - Multimodal All-Optic UHV Atomic Force Microscopy for Chemical Contrast

Keywords

Force curve, Chemical Contrast, Colour AFM, UHV Multimodal nc-AFM.

Contact LIMMS/CNRS-IIS (UMI 2820)
Institute of Industrial Science, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
Phone:+81 (0)3 5452 6036 / Fax:+81 (0)3 5452 6088
E-mail denis at iis.u-tokyo.ac.jp
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Resume

Short resume :
2012-now Actual position
2008-2012 Here
2004-2008 Here
2001-2003 Here

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Research Projects in Limms

1- Multimodal All-Optic UHV Atomic Force Microscopy for Chemical Contrast

Context :
Science community is still waiting for the ideal atomic microscope that could allow clean observation of the specificity of the state of atoms on a surface in a discriminating manner. Dynamic Force Microscopy (DFM) would be the ultimate chemical contrast technique if it was not restricted to frequency shift mappings and could also summarise, in a 2D image, all the physical properties of the atoms on the sample.
Objectives & Methods :
With our new home-made UHV nc-AFM, we developed an innovative scanning method allowing simultaneous acquisition of the topography with the chemical contrast of all the atoms on the surface. The 2D chemical contrast mapping is generated by merging different physical parameter channels, each one corresponding to one component of the final colour [1].
Results :
All the theoretical aspects have been fully demonstrated by Pierre E. Allain [2] and were confirmed experimentally [3]. Important progresses in noise reduction and sensitivity were obtained with the use of the new specific electronic equipments made by Dai Kobaysahi. Good improvements in atomic resolution imaging could also be achieved recently thanks to the useful advices of the former lab member Frank Rose.
“The voyage of discovery is not in seeking new landscapes but in having new eyes.” - Marcel Proust

                           

 

 

Fig1Damiron.png

 

Fig.1 Example of atomic resolution obtained on Si(111).

               Fig2Damiron.jpg

Fig. 2 On-the-fly acquisition of the frequency shift (indigo) and complementary interaction

measurements on Si(111) using lock-in amplifiers during force curve acquisition.

References:
[1] D. Damiron, et al., ICSPM22, Atagawa, Japan 2014 (Oral).
[2] P.E. Allain, et al., under submission.
[3] D. Damiron et al., under submission.
2- Towards multimodal all-optic UHV atomic force microscopy

Context :
Recent improvements of scanning probe microscopy techniques have made possible the mapping of very fragile micro structures and even molecules. [1]
Objectives :
We aim to develop a new AFM technique in order to obtain real-time chemical contrast with multi-frequency modulation at high frequency.
Methods :
We have implemented a new “all-optic” Ultra High Vacuum Atomic Force Microscope. Optical excitation is photothermal and detection is made directly by laser Doppler interferometer. Cantilever excitation is extremely clean, even at low amplitude (10 pm) and high frequency (~10 MHz).
Results :
By using multi-frequency modulation, small amplitude of drive and high frequency operation mode, the gradient of frequency shift profiles could be efficiently obtained. Structure of Si(111) 7x7 have been correctly identified with real-time detection of gradient of frequency shift. The lateral mode is also under investigation for its sensitivity toward the frictional properties of the surface.[3] This technique can be useful for studying inhomogeneous alloys or polymer blends since it enhances the contrast at the boundary between different compounds.

Denis_Damiron_Fig1.JPG

Fig. 1 Frequency shift (Δf) versus distance curves on KBr(001) (approach and retraction).

Denis_Damiron_Fig2.JPG

Fig. 2 Simultaneous detection of Δf and its gradient on KBr a during a force curve acquisition.

References and Publications:
[1] S Kawai, et al. Phys. Rev B, 2009.
[2] D. Damiron, M. Othman, Y. Toriyama, D. Kobayashi, H. Kawakatsu.Oral presentation. nc-AFM 2012 Ceský Krumlov Czech Republic.
[3] D. Damiron, M. Othman, Y. Toriyama, D. Kobayashi, H. Kawakatsu.Oral presentation. 2013 MRS Spring Meeting San Francisco.

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Main publication List (papers, conferences and patent)

2015

Journals
Conferences
  1. D. DamironP. Allain, Y. Miyazaki, D. Kobayashi, N. Sasaki, H. Kawakatsu, " Study on the bottom tracking technique for chemical contrast imaging ", 62nd JSAP Spring Meeting, Tokyo, Japan, March 11-14, 2015. (Oral).

 

2014

Journals
Conferences
  1. D. Damiron, P.E. Allain, Y. Miyazaki, D. Kobayashi, K. Nagao, K. Edagawa, N. Sasaki,H. Kawakatsu. Efforts to Enhance Chemical Contrast between Atomic Species while Scanning with an All Optical Non-Contact Atomic Force Microscope. International Colloquium on Scanning Probe Microscopy (ICSPM22), Atagawa Heights, Japan, 2014. (Oral)

  2. P. E. Allain, D. Damiron, Y. Miyazaki, D. Kobayashi, K. Nagao, K. Edagawa N. Sasaki, H. Kawakatsu. All optical non-contact Atomic Force Microscope working with high frequency non-flexural modes towards shorter range chemical contrast. 7th International Symposium on Surface Science (ISSS-7), Matsue, Japan, 2014. (Oral)

  3. Y. Miyazaki, P. E. Allain, D. Damiron, Y. Toriyama, K. Nagao, D. Kobayashi, N. Sasaki, K. Edagawa ,H. Kawakatsu. Real time chemical contrast technique by direct detection of local minima of frequency shifts. 7 th International Symposium on Surface Science (ISSS-7), Matsue, Japan, 2014. (Oral)

  4. D. Damiron, P. Allain, Y. Toriyama, Y. Miyazaki, H. Kawakatsu*, Controlling tip sample distance at the local minima of torsional frequency shift -Towards chemical contrast imaging with the torsional mode, International Nanotribology Forum, Kerala, India, 2014. (Oral)

  5. D. Damiron, Y. Toriyama, P. Allain, D. Kobayashi, Y. Miyazaki, N. Sasaki, H. Kawakatsu*, Towards atomic force microscopy with chemical contrast, 5th International Workshop on Advanced Scanning Probe Microscopy Techniques, Karlsruhe, Germany, 2014. (Oral)

  6. P. Allain, D. Damiron, Y. Toriyama, K. Nagao, D. Kobayashi, K. Edagawa, H. Kawakatsu, Quasicrystals: a benchmark sample for colour AFM. JSAP Spring Meeting, Kanagawa, Japan, 2014. (Oral)

  7. D. Damiron, Y. Toriyama, P. Allain, Y. Miyazaki, D. Kobayashi, H. Kawakatsu, An all-optic UHV atomic force microscopy for chemical contrast in lateral mode. JSAP Spring Meeting, Kanagawa, Japan, 2014. (Oral)

Poster Presentations
  1. Y. Miyazaki, P.E. Allain, D. Damiron, D. Kobayashi, K. Nagao, K. Edagawa, N. Sasaki, H. Kawakatsu. Noise consideration for extraction of information from frequency shift curves for chemical contrast.-Algorithms for treating quantitative data into physical parameters-,International Colloquium on Scanning Probe Microscopy (ICSPM22), Atagawa Heights, Japan, 2014. (Poster)

  2. P. Allain, D. Damiron, Y. Toriyama ,Y. Miyazaki , D. Kobayashi1 K. Nagao , K. Edagawa; H. Kawakatsu. Versatile chemical contrast mapping technique by direct detection of local minima of frequency shifts. – Flexural and torsional modes – NC-AFM, Tsukuba, Japan, 2014. (Poster)

  3. D. Damiron, P. Allain, Y. Toriyama, Y. Miyazaki, D. Kobayahi, H. Kawakatsu. Optimization of amplitude of drive and dither for “colour AFM”. NC-AFM, Tsukuba, Japan, 2014. (Poster)

 

2013 and prior

Journals
Conferences
  1. D. Damiron, Y. Toriyama, D. Kobayashi,S. Takeda, N. Sasaki, P. Allain and H. Kawakatsu, Towards Realtime Atomic Force Microscopy with Chemical Contrast ALC Hawaii, 2013. (Oral)

  2. D. Damiron, Y. Toriyama, M. Othman, D. Kobayashi, H. Kawakatsu, AFM for real time chemical identification and its application in lateral force microscopy. MRS Spring Meeting and Exhibit, San Francisco, USA, 2013. (Oral)

  3. D. Damiron, Y. Toriyama, M. Othman, D. Kobayashi, H. Kawakatsu*, Towards Atomic Force Microscopy with Chemical Contrast. MRS Spring Meeting and Exhibit, San Francisco, USA, 2013. (Oral)

  4. Y. Toriyama, D. Damiron, M. Othman, D. Kobayashi, H. Kawakatsu, AFM for real time chemical identification working in flexural mode.  MRS Spring Meeting and Exhibit, San Francisco, USA, 2013. (Oral)

  5. D.Damiron, Y. Toriyama, M. Othman, P. Allain, D. Kobayashi, H. Kawakatsu, An all-optic UHV atomic force microscopy for chemical identification working in lateral mode. JSAP Spring Meeting, Kanagawa, Japan, 2013. (Oral)
  6. D. Damiron, M. Othman, Y. Obata, D. Kobayashi, H. Kawakatsu. Towards multimodal all-optic UHV Atomic Force Microscopy, NC-AFM, Krumlov , Czech republic, 2012. (Oral)

Poster Presentations
  1. D. Damiron, Y. Toriyama, M. Othman, D. Kobayashi, H. Kawakatsu, AFM for Real Time Chemical Identification and its Application in Lateral Force Microscopy. Friction meeting. Friction and Rheology workshop, Kyoto, Japan, 2012. (Poster)

  2. D. Damiron, M. Othman, Y. Obata, D. Kobayashi, H. Kawakatsu. Towards multimodal all-optic UHV atomic force microscopy. JSAP spring meeting, Tokyo, Japan, 2012. (Poster)

  3. D. Damiron, M. Othman, Y. Obata, D. Kobayashi, H. Kawakatsu. Towards multimodal all-optic UHV atomic force microscopy, seeing at the nanoscale Bruker meeting, Bristol, England, 2012. (Poster)

  4. D. Damiron, Y. Toriyama, M. Othman, D. Kobayashi, H. Kawakatsu, Towards multimodal all-optic UHV atomic force microscopy. 4th Multifrequency AFM Conference, Madrid, Spain, 2012. (Poster)

  5. Y. Toriyama, D. Damiron, M. Othman, D. Kobayashi, H. Kawakatsu, AFM with chemical contrast and its application in lateral force microscopy. ICSPM 20, Naha, Japan, 2012. (Poster)

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