Markku KAINLAURI

 M.KAINLAURI.jpg Host Laboratory KAWAKATSU LAB.
Position in LIMMS EUJO-LIMMS Researcher (VTT)
Main Research Topic in LIMMS NANOTECH - Field Ion Microscopy of Graphene Nano-Oscillators
Keywords

FIM, Graphene, Pt

Contact

LIMMS/CNRS-IIS (UMI 2820)
Institute of Industrial Science, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
Phone:+81 (0)3 5452 6036 / Fax:+81 (0)3 5452 6088

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VTT Technical Research Centre of Finland 
Tietotie 3, P.O. Box 1000, FI-02044 VTT, Espoo, Finland 
Tel. +358 40 8251703  /  Fax +358 20 722 7012

E-mail markku at iis.u-tokyo.ac.jp
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Resume

Short resume :
2012-now Actual position
2008-2012 Here
2004-2008 Here
2001-2003 Here

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Research Projects in Limms

1- Field Ion Microscopy of Graphene Nano-Oscillators
 
Context :
Graphene is a versatile material and a good candidate for making nano-structures  on  a range of substrates. The frequency range of a graphene oscillator or sensors arising from it can reach frequencies up and above the GHz range. One possibility for characterization of such devices is the use of emission. By exploiting the operating principles of FEM (field emission microscopy), FIM (field ion microscopy) and FFEC (femtosecond field-emission camera), we intend to characterize the oscillators at elevated frequencies.
Objectives & Methods :
Field Ion Microscopy (FIM) is an interesting tool for characterizing atomic structure at the apex of a sharp metal tip [1]. High electric field at the apex ionizes imaging gas molecules which are accelerated by the field and detected at the imaging screen. By placing small oscillators, such as self-assembled monolayers or graphene, on the tip apex, their oscillating characteristics can be studied. Graphene can be directly deposited on various metal surfaces by Chemical Vapor Deposition (CVD) at high temperatures which makes it an ideal candidate for FIM characterization. Our goal is to measure the oscillations of graphene ridges grown on platinum tips. 
Results :
The results will help to characterize the nano-oscillators and to improve the fabrication technique including, as well as control and design of the sensors.
picture_for_booklet_Markku.png
                                          Fig. 1 Illustration of the FIM measurement setup showing a graphene nano-oscillator on a Pt tip. Oscillations can be directly seen as blurring of atomic sites in the FIM image.
 
References :
[1] Erwin Wilhelm Müller: Das Feldionenmikroskop, Z. Phys. 131, 136 (1951)

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Main publication List (papers, conferences and patent)

2013

Journals
Conferences

2012

Journals
Conferences

2011

Journals
Conferences

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