Pierre ALLAIN, Dr.

 P.ALLAIN.JPG Host Laboratory KAWAKATSU LAB.
Position in LIMMS Postdoctoral Researcher
Main Topic Research in LIMMS

NANOTECH - Coupling Colour-AFM with Transmission Electro Microscope and Field Ion Microscope

Keywords

Non-contact AFM, Chemical contrast, FIM, TEM, Quasicrystal

Contact LIMMS/CNRS-IIS (UMI 2820)
Institute of Industrial Science, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
Phone:+81 (0)3 5452 6036 / Fax:+81 (0)3 5452 6088
E-mail allain at iis.u-tokyo.ac.jp
Download icon_pdf.gifAbstract2014_Allain.pdf

Resume

He was a graduate research assistant in the Laboratory of Solid State Physics (LPS) in Orsay working on Klein tunneling in graphene in 2008 and at the Hong Kong Polytechnic University working on PVDF-based hydrodynamic force sensor in 2009.

 In 2012, he received a PhD degree in Physics from University Paris-Sud for its works at Institut d’Electronique Fondamentale on the electro-thermo-mechanical properties of top-down fabricated silicon nanowires.

Since November 2012, he is working in LIMMS hosted by the Kawakatsu Lab, working on the new type of atomic force microscope (AFM) allowing chemical contrast and ways to implement this AFM into transmission electron microscope (TEM) and field ion microscope (FIM).

His general research interests include high-precision metrology including signal processing and instrumentation as well as N&MEMS

Academic Course of Study:

  • Oct. 2012 : PhD in Physics from Paris-Sud University
  • Sept. 2009 : Master’s degree in Micro/Nano-Technologies and Magistère degree (Enhanced Master’s degree) in Fundamental Physics at Paris-Sud, University
  • Sept. 2007 : Exchange student at California State University of Los Angeles during the first year of June 2008
  • June 2007 : Bachelor’s degree in Fundamental Physics at the University of Paris-Sud 11
Research & Working Resume :
Nov. 2012 - now

JSJS Post-Doctoral fellow at the University of Tokyo, LIMMS Kawakatsu Lab.

Projects: implementation of a new type of atomic force microscopy (AFM) for chemical contrast; development of a Transmission electron microscope (TEM) coupled with an AFM for 3D mechanical characterisation of nano-objects (3D force spectroscopy, nanotribology); measurement of vibration of nano-oscillators using a field-ion microscope.

Sept. 2009 -  Oct. 2012

Doctoral research at the Institute for fundamental electronics (IEF), Orsay France

Subject: Electro-thermomechanical behaviour of Silicon Nanowires for MEMS applications

2009

Research assistant at the Hong Kong polytechnic University (PolyU) in Hong Kong (5 months)

Subject: PDMS Sensors for Microfluidics applications

2008

Internship at the Laboratoire de Physique des Solides (LPS) in Orsay (Univ. Paris-Sud) (2 months)

Subject: Tunnelling Klein effect on the graphene sheet.

2007

Internship at the University of Ireland, Maynooth, Ireland (2 months)

Subject: IR Spectrum recording of stimulating emission of porphyrins

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Research Projects in Limms

1- Coupling Colour-AFM with Transmission Electro Microscope and Field Ion Microscope
 
Context :
Surface science has been revolutionised in the 1980 by AFM and STM technologies. In the 1990, non-contact AFM has become a standard. In the past 15 years, atomic resolution has been routinely achieved with sharp tips terminated with a single molecule. Routine discriminative chemical contrast of surface is one of the challenges on the field.
Objectives :
We aim to implement fast “real time” chemical characterisation of surfaces with atomic resolution. This “colour AFM” could be a new paradigm in the field of AFM technology.
In parallel to the development of this technology, we aim to combine the colour AFM with other atomic resolution microscopes. First with the Transmission Electron Microscope (TEM) that can routinely achieve atomic resolution using picometer-sized electron wavelength. In our case, 3D nano-objects can be characterized using this combined TEM-AFM.
Our laboratory also studies the combination of an AFM with a Field Ion Microscope (FIM). The FIM is an apparatus that allows the direct observation of individual atoms. We use this microscope to visualise vibration of organic molecules such as alkanethiols.
Methods :
Our home-made AFM uses a modulated blue laser to vibrate a cantilever at its mechanical resonance frequency. This so-called photothermal excitation offers extremely clean excitation of the AFM cantilever at low amplitude (10 pm) and high frequency (~10 MHz), making the system a good approach for high frequency, small amplitude multimodal AFM with various control schemes. Thanks to a Laser Doppler interferometer, a small shift of the resonance frequency can be detected. This shift of frequency (Δf), gives information about the atomic force between the tip of cantilever and the scanned atoms.
We have applied this method to image Si (111) 7x7 surface reconstruction and a four-element alloy. Recently this colour AFM has been used to image quasicrystals structures (Al-Pd-Mn) alloys. Due to their unique aperiodic features, the sample is an ideal benchmark for our AFM as well as others.

Fig1.jpg

Fig. 1 Optical lens (a) shining lasers onto a vibrating cantilever

(b) scanning over a silicon surface (c) sample.

fig2.jpg

Fig. 2 TEM image of AFM cantilever approaching a silicon sample.

fig3.jpg

Fig. 3 Vibrating silicon cantilever surface visualised by FIM.

Results :
We have applied this method to image Si (111) and a four-element alloy. Recently this colour AFM has been used to image quasicrystals structures (Al-Pd-Mn) alloys. Due to their unique aperiodic features, they offer an ideal benchmark for our AFM.
Thorough theoretical aspects of this method have been demonstrated [2] and were confirmed experimentally [3]. Important progresses in noise reduction and sensitivity were obtained with the use of the new specific electronic equipment made by Dai Kobaysahi.
 
References:
[1] P. Allain et al. (ISSS-7), Matsue, Japan, 2014. Oral.
[2] P.E. Allain et al., Submitted
[3] D. Damiron et al., Submitted.

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Main publication List (papers, conferences and patent)

 2015

Journals

 

Conferences
  1. D. Damiron, P. Allain, Y. Miyazaki, D. Kobayashi, N. Sasaki, H. Kawakatsu, " Study on the bottom tracking technique for chemical contrast imaging ", 62nd JSAP Spring Meeting, Tokyo, Japan, March 11-14, 2015. Oral

 

 2014

Journals

 

Conferences
  1. D. Damiron, P.E. Allain, Y. Miyazaki, D. Kobayashi, K. Nagao, K. Edagawa, N. Sasaki,H. Kawakatsu, Efforts to Enhance Chemical Contrast between Atomic Species while Scanning with an All Optical Non-Contact Atomic Force Microscope. International Colloquium on Scanning Probe Microscopy (ICSPM22), Atagawa Heights, Japan 2014 (Oral)
  2. Y. Miyazaki, P.E. Allain, D. Damiron, D. Kobayashi, K. Nagao, K. Edagawa, N. Sasaki, H. Kawakatsu, Noise consideration for extraction of information from frequency shift curves for chemical contrast.-Algorithms for treating quantitative data into physical parameters-, International Colloquium on Scanning Probe Microscopy (ICSPM22), Atagawa Heights, Japan 2014 (Poster)
  3. P. E. Allain, D. Damiron, Y. Miyazaki, D. Kobayashi, K. Nagao, K. Edagawa N. Sasaki, H. Kawakatsu. All optical non-contact Atomic Force Microscope working with high frequency non-flexural modes towards shorter range chemical contrast. 7th International Symposium on Surface Science (ISSS-7), Matsue, Japan, 2014. Oral.
  4. Y. Miyazaki, P. E. Allain, D. Damiron, Y. Toriyama, K. Nagao, D. Kobayashi, N. Sasaki, K. Edagawa ,H. Kawakatsu.  Real time chemical contrast technique by direct detection of local minima of frequency shifts. 7 th International Symposium on Surface Science (ISSS-7), Matsue, Japan, 2014. Oral.
  5. P. Allain, D. Damiron, Y. Toriyama ,Y. Miyazaki , D. Kobayashi1 K. Nagao , K. Edagawa; H. Kawakatsu. Versatile chemical contrast mapping technique by direct detection of local minima of frequency shifts.  – Flexural and torsional modes – NC-AFM, Tsukuba, Japan, 2014. Poster.
  6. D. Damiron, P. Allain, Y. Toriyama, Y. Miyazaki, D. Kobayahi, H. Kawakatsu. Optimization of amplitude of drive and dither for “colour AFM”. NC-AFM, Tsukuba, Japan, 2014. Poster.
  7. Y. Kumata, S. Takeda, P. Allain, K. Nakano, D. Kobayashi, H. Kawakatsu. Effect of TEM beam on frequency shift curves. NC-AFM, Tsukuba, Japan, 2014. Poster.
  8. D.Damiron, P. Allain, Y. Toriyama, Y. Miyazaki, H. Kawakatsu, "Controlling tip sample distance at the local minima of torsional frequency shift -Towards chemical contrast imaging with the torsional mode", International Nanotribology Forum, Kerala India, 2014. Oral
  9. D.Damiron, Y. Toriyama, P. Allain, D. Kobayashi, Y. Miyazaki, N. Sasaki, H. Kawakatsu, Towards atomic force microscopy with chemical contrast, 5th International Workshop on Advanced Scanning Probe Microscopy Techniques, Karlsruhe 2014. Oral
  10. P. Allain, D. Damiron, Y. Toriyama, K. Nagao, D. Kobayashi, K. Edagawa, H. Kawakatsu, Quasicrystals: a benchmark sample for colour AFM. JSAP Spring Meeting, Kanagawa, Japan, 2014. Oral
  11. D. Damiron, Y. Toriyama, P. Allain, Y. Miyazaki, D. Kobayashi, H. Kawakatsu, An all-optic UHV atomic force microscopy for chemical contrast in lateral mode. JSAP Spring Meeting, Kanagawa, Japan, 2014. Oral
  12. D. Damiron, P. Allain, Y. Toriyama, D. Kobayashi, Y. Miyazaki, N. Sasaki H. Kawakatsu,“Realisation of an atomic force microscope with a chemical contrast”, Workshop  on Nanomechanical characterization by real-time TEM observation and MEMS, Univ. Tokyo, 2014

 

 2013 and prior

Journals

 

Conferences
  1. P. Allain, "Combinaison d'un microscope a force atomique "couleur" avec d'autres microscopes a resolution atomique", JFR13, Maison Franco-Japonaise, Tokyo (29-12-2013).
  2. H. Nishizawa, P.E. Allain, Y. Honda, D. Hirayama, D. Kobayashi, H. Kawakastu,”Self-assembled monolayers dynamics observed by Field-ion-microscopy”, JSAP Spring Meeting, Kanagawa, Japan, 2013, Poster
  3. D. Damiron, Y. Toriyama, M. Othman, P. Allain, D. Kobayashi, H. Kawakatsu, “An all-optic UHV atomic force microscopy for chemical identification working in lateral mode”, JSAP Spring Meeting, Kanagawa, Japan, 2013 Oral
  4. Y. Toriyama, D. Damiron, M. Othman, P. Allain, Y. Obata, D.Kobayashi, H. Kawakatsu, “Chemical Identification with UHV Atomic Force Microscopy in Vertical Mode.”, JSAP Spring Meeting, Kanagawa, Japan, 2013 Oral
  5. P.Allain "Coupling Colour-AFM with Transmission Electron Microscope and Field Ion Microscope", Workshop de l’Association des Unités de Recherche CNRS d’@sie, Tokyo 2013, Oral
  6. D. Damiron, Y. Toriyama, D. Kobayashi,S. Takeda, N. Sasaki, P. Allain and H. Kawakatsu, “Towards Realtime Atomic Force Microscopy with Chemical Contrast”, ALC 2013 Hawaii, Oral
  7. H. Nishizawa, P. Allain, D. Kobayashi and H. Kawakatsu, “Development of Atom Probe Atomic Force Microscope for Chemical Identification”, ICSPM 20, Okinawa, Japan. 2012, Poster

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